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Alyssa Grace Gablan

Publications (3)

Improved Die Attribute Recognition via Colored Glass Wafer

Alyssa Grace Gablan, Jerome Dinglasan & Frederick Ray Gomez · Journal of Engineering Research and Reports · 2021

The rise of various Wafer technologies has been developed based on industries and applications requirement. Highest quality of material characterization is complex and requires specialized process equipment and manufacturing procedures to meet defined design standards. The paper...

Open access Research Article 10.9734/jerr/2021/v20i617332

Improvement on QFN Leadframe Design of Extended Leads to Support the Mitigation of Mold Flash Occurrence

Alyssa Grace Gablan, Frederick Ray Gomez & Anthony Moreno · Journal of Engineering Research and Reports · 2021

Parameter optimization is not only the key to find the most favorable and best solution as variable chances of failure modes may happen at extreme case conditions at unexpected period. Packaging design robustness is much resilient to establish a satisfactorily good quality produc...

Open access Research Article 10.9734/jerr/2021/v20i517309

Enhanced Die Attach Process Defect Recognition on QFN Leadframe Packages

Marque Ryan Salcedo, Alyssa Grace Gablan, Jerome Dinglasan & Frederick Ray Gomez · Journal of Engineering Research and Reports · 2021

Advanced packaging at the back-end semiconductor manufacturing characterizes various equipment capabilities per device requirement. High resolution imaging for inspection system during die attach process has gained its interest to feature automated selections during in-line proce...

Open access Research Article 10.9734/jerr/2021/v20i317286