Arvind Kumar Saxena

Significance of Using Scanning Electron Microscopy with Energy Dispersive X-ray Spectrometry (SEM-EDX) for Analysis of Evidence Material in Forensic Sciences

Jumisree Sarmah Pathak & Arvind Kumar Saxena · Asian Journal of Research and Reviews in Physics · 2024

Forensic applications of Scanning Electron Microscopy (SEM) are found mostly in areas where there is a need for good imaging at relatively high magnifications. SEM enables the forensic scientist to examine specimens at much higher magnification than those possible with optical mi...