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Bryan Christian S. Bacquian

Publications (15)

Die Attach Film Bleed out Resolution through Process Optimization on DFN Packages

Bryan Christian S. Bacquian, Edwin M. Graycochea Jr. & Frederick Ray I. Gomez · Journal of Engineering Research and Reports · 2020

The development of new technology with thinner and smaller packages has become the movement and focus on semiconductor assembly industry. This paper presents an improvement done in dual-flat no-leads (DFN) package to resolve the quantity of rejection due to die attach film (DAF)...

Open access Research Article 10.9734/jerr/2020/v17i317189

Ball Misplace Mitigation through Process Optimization of Advanced Leadframe Package

Bryan Christian S. Bacquian, Frederick Ray I. Gomez & Edwin M. Graycochea Jr. · Journal of Engineering Research and Reports · 2020

One of the challenging assembly processes in semiconductor manufacturing industry is stencil printing using solder paste as direct material. With this technology, some issues were encountered during the development phase of an advanced leadframe device and one of which is the sol...

Open access Research Article 10.9734/jerr/2020/v16i417176

Bond Line Thickness Characterization for QFN Package Robustness

Bryan Christian S. Bacquian, Edwin M. Graycochea Jr, Frederick Ray I. Gomez & Rennier S. Rodriguez · Journal of Engineering Research and Reports · 2020

The paper focused on the evaluation of quad-flat no-leads (QFN) semiconductor package with small silicon die on different machine platforms to achieve a higher bond line thickness (BLT) of greater than 30 µm. The characterization or evaluation was narrowed down into two main dieb...

Open access Research Article 10.9734/jerr/2020/v14i217119

A Study of the Effect of Back Grind Wheels on Wafer Edge Chippings and Die Strength

Bryan Christian S. Bacquian · Journal of Engineering Research and Reports · 2020

The drive for thinner package architecture is already becoming a necessity. There were a need of thinner Integrated Circuit or IC in order to fit in to thinner applications like mobile phones. One of the major semiconductor process that enables miniaturization was wafer back grin...

Open access Research Article 10.9734/jerr/2020/v11i117049

Critical Insights in the Application of Convection and Pressure Curing in Eliminating DAF Voids

Bryan Christian S. Bacquian, Rennier Rodriguez & Edwin M. Graycochea · Journal of Engineering Research and Reports · 2020

The absent of reliable production controls for Die Attach Film (DAF) voids detection allowed defect escapee for Ball Grid Array (BGA) devices using non-conductive film material leading to gross assembly rejection and customer complaints. This paper presents the evaluation of pres...

Open access Research Article 10.9734/jerr/2020/v10i417047

A Comprehensive Study for Specialized Silicon-on-Insulator Wafers

Bryan Christian S. Bacquian & Frederick Ray I. Gomez · Journal of Engineering Research and Reports · 2020

The relentless advancement and trends on thinner packages have become the focus in the semiconductor manufacturing industry. The requirement of thinner packages also demands a thinner vertical structure of the semiconductor electronic design. As a major contributor on the vertica...

Open access Research Article 10.9734/jerr/2020/v10i217037

Wafer Tape Selection Analysis for Adhesion Problem Mitigation

Bryan Christian S. Bacquian & Frederick Ray I. Gomez · Journal of Engineering Research and Reports · 2019

Wafer passivation or the protective layer of the internal circuitry of the die plays a major role of providing protection and the isolation of electrical stability of the active circuit on the top area of the wafer. Passivation is normally a screen of an oxide layer on the surfac...

Open access Research Article 10.9734/jerr/2019/v6i416958

A Study of Wafer Backgrinding Tape Selection for SOI Wafers

Bryan Christian S. Bacquian & Frederick Ray I. Gomez · Journal of Engineering Research and Reports · 2019

The continuous development and trends on thinner semiconductor packages have become the focus in the semiconductor industry. The necessity of thinner packages also demands a thinner vertical structure of the integrated circuit (IC) design. As a major contributor on the vertical s...

Open access Research Article 10.9734/jerr/2019/v6i216943

A Study of Vacuum Efficiency for Silicon on Insulator Wafers

Bryan Christian S. Bacquian & Frederick Ray I. Gomez · Journal of Engineering Research and Reports · 2019

The development on thinner packages has become the trend and focus in semiconductor packaging industry. The necessity of thinner packages also entails a thinner vertical structure of the integrated circuit (IC) design. As a major contributor on the vertical structure of the IC pa...

Open access Research Article 10.9734/jerr/2019/v6i116936

Backside Chippings Improvement through Wafer Dicing Parameter Optimization and Understanding the Anistropic Silicon Properties

Aiza Marie E. Agudon & Bryan Christian S. Bacquian · Journal of Engineering Research and Reports · 2021

Semiconductor Companies and Industries soar high as the trend for electronic gadgets and devices increases. Transition from “manual” to “fully automatic” application is one of the advantages why consumer adapt to changes and prefer electronic devices as one of daily answers. Indi...

Open access Research Article 10.9734/jerr/2021/v20i717350

Laser DAF Cut: A Breakthrough Approach of Die Attach Film Singulation for Thin Wafers

Aiza Marie E. Agudon, Frederick P. Arellano & Bryan Christian S. Bacquian · Journal of Engineering Research and Reports · 2021

Today, semiconductor world is becoming more inclined to thinner Integrated Circuit (IC) packages. IC packages will require thinning of the internal configuration of the package, which involves the die or the wafer and the adhesive material, which is the Die Attach Film (DAF). Ali...

Open access Research Article 10.9734/jerr/2021/v20i717343

Introduction of Laser Pi-Grooving as Breakthrough Solution to Enhance die Strength of 40 nm ulow-k CMOS Silicon Technology during Wafer Saw Process

Aiza Marie E. Agudon, Hynlie B. Inguin & Bryan Christian S. Bacquian · Journal of Engineering Research and Reports · 2021

Nowadays, semiconductors and electronics are becoming part of our everyday activities. As the Integrated circuits become more useful to people, it also requires more function, which contain more complex and compact components. Aligned to this package requirement, the more challen...

Open access Research Article 10.9734/jerr/2021/v20i517308

Die Attach Process Defect Mitigation through Design Improvement on Anvil Block Tooling

Rennier S. Rodriguez, Frederick Ray I. Gomez & Bryan Christian S. Bacquian · Journal of Engineering Research and Reports · 2020

Process improvement through modification in the design of indirect material is one potential direction to improve the productivity during assembly manufacturing. In this paper, an augmented design of anvil block is presented to reduce the crumpled strips, leadframe bending and de...

Open access Research Article 10.9734/jerr/2020/v17i217182