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Jerome Dinglasan

Publications (4)

Glass Die Ink Marking Media Selection for a Robust Glass Attach Process

Jerome Dinglasan, Aiza Marie Agudon & Frederick Ray Gomez · Journal of Engineering Research and Reports · 2021

Glass material used on a semiconductor device for isolating currents are one of the new breakthroughs of the modern world. Challenges are inevitable due to its complex characteristics and unique appearance. The study focuses on the phenomenon of reject glass die unrecognized, pic...

Open access Research Article 10.9734/jerr/2021/v20i817365

Die Attach Curing Program Automation of N2 Parameter for Process Robustness

Jerome Dinglasan, Rogel Dela Rosa & Frederick Ray Gomez · Journal of Engineering Research and Reports · 2021

In the world of semiconductor industry, automation plays a big role on every manufacturing plants to improve efficiency, prevent product yield losses, and making sure that top quality products will be delivered on end user. On die attach curing process of manufacturing semiconduc...

Open access Research Article 10.9734/jerr/2021/v20i417304

Improved Die Attribute Recognition via Colored Glass Wafer

Alyssa Grace Gablan, Jerome Dinglasan & Frederick Ray Gomez · Journal of Engineering Research and Reports · 2021

The rise of various Wafer technologies has been developed based on industries and applications requirement. Highest quality of material characterization is complex and requires specialized process equipment and manufacturing procedures to meet defined design standards. The paper...

Open access Research Article 10.9734/jerr/2021/v20i617332

Enhanced Die Attach Process Defect Recognition on QFN Leadframe Packages

Marque Ryan Salcedo, Alyssa Grace Gablan, Jerome Dinglasan & Frederick Ray Gomez · Journal of Engineering Research and Reports · 2021

Advanced packaging at the back-end semiconductor manufacturing characterizes various equipment capabilities per device requirement. High resolution imaging for inspection system during die attach process has gained its interest to feature automated selections during in-line proce...

Open access Research Article 10.9734/jerr/2021/v20i317286