Modeling of Leadframe Strip Warpage after Die Attach Cure Process

Abstract

In the leadframe package assembly process, silicon die is attached to the leadframe using a die attach adhesive material and the bonded strip is then cured. However, excessive strip warpage after the die attach cure process is a challenging problem that also affects the succeeding assembly processes. In this study, strip warpage modeling was done using a finite element analysis (FEA) technique to understand the warpage mechanism after die attach cure and find options to reduce strip warpage. The effect of changing the leadframe thickness, die thickness, and the leadframe design in terms of the number of strip panels or changing the connecting bar was analyzed. Modeling demonstrated that lead frame contracts faster than the silicon die resulting in the “frowning” warpage that agrees with the actual observation. It was also shown that increasing the die thickness by 25% results in 27% warpage reduction. Results also showed that increasing the number of panels or maps in a strip could significantly reduce the strip warpage. Improving the panel-to-panel isolation using stress relief cuts is also another option to reduce warpage after die attach cure.