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Research Article Open access CC BY 4.0

Warpage Mitigation through Diebond Process Improvement with Enhanced Leadframe Configuration

Edwin M. Graycochea Jr., Frederick Ray I. Gomez, Rennier S. Rodriguez

Journal of Engineering Research and Reports · pp. 39–42 · Published 7 Feb 2020

10.9734/jerr/2020/v10i217035

Abstract

This paper presents an improvement in the design of quad flat no-leads (QFN) leadframe material to reduce the amount of unit rejection due to excessive leadframe warpage observed after die attach curing (DAC) process. The enhanced leadframe design includes modification through increasing the number of unit panels from 2 maps structure into 4-panel configuration to integrate mechanical relief for coefficient thermal expansion (CTE) mismatch between different material composition present inside the device. The implementation of this design in the assembly of QFN successfully reduced the amount of leadframe warpage into manufacturable level with positive impact in production output and assembly yield.

Quad flat no-leads (QFN) warpage leadframe coefficient of thermal expansion (CTE) die attach process diebond process.

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